전자 부품 : SN74BCT8373ADW

제조 업체 : Texas Instruments

포장 :

핀을 :

설명 : SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES

온도 : 분 °C | 맥스 °C

Datasheet : SN74BCT8373ADW PDF

• SN74BCT8373
• SN74BCT8373A
• SN74BCT8373ADW
• SN74BCT8373ADWE4
• SN74BCT8373ADWR
• SN74BCT8373ADWRE4
• SN74BCT8373ANT
• SN74BCT8373ANTE4
• SN74BCT8374A
• SN74BCT8374ADW
• SN74BCT8374ADWE4
• SN74BCT8374ADWG4
• SN74BCT8374ADWR
• SN74BCT8374ADWRE4
• SN74BCT8374ADWRG4