전자 부품 : SN74BCT8374ADWE4

제조 업체 : Texas Instruments

포장 :

핀을 :

설명 : SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

온도 : 분 °C | 맥스 °C

Datasheet : SN74BCT8374ADWE4 PDF

• SN74BCT8374A
• SN74BCT8374ADW
• SN74BCT8374ADWE4
• SN74BCT8374ADWG4
• SN74BCT8374ADWR
• SN74BCT8374ADWRE4
• SN74BCT8374ADWRG4
• SN74BCT8374ANT
• SN74BCT8374ANTE4